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Room temperature observation of biexcitons in exfoliated WS_2 monolayers

机译:剥离的WS_2单层中双激子的室温观察

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摘要

Single layers of WS_2 are direct gap semiconductors with high photoluminescence (PL) yield holding great promise for emerging applications in optoelectronics. The spatial confinement in a two-dimensional monolayer together with the weak dielectric screening leads to huge binding energies for the neutral excitons as well as other excitonic complexes, such as trions and biexcitons whose binding energies scale accordingly. Here, we report on the existence of biexcitons in mechanically exfoliated WS_2 flakes from 78 K up to room temperature. Performing temperature and power dependent PL measurements, we identify the biexciton emission channel through the superlinear behavior of the integrated PL intensity as a function of the excitation power density. On the contrary, neutral and charged excitons show a linear to sublinear dependence in the whole temperature range. From the energy difference between the emission channels of the biexciton and neutral exciton, a biexciton binding energy of 65-70 me V is determined.
机译:WS_2的单层是具有高光致发光(PL)产量的直接间隙半导体,对光电中的新兴应用前景广阔。二维单层的空间限制以及弱的介电屏蔽会导致中性激子以及其他激子复合物(例如三能子和双激子)的巨大结合能,结合能相应地缩放。在这里,我们报道了从78 K到室温,机械剥落的WS_2薄片中存在双激子。进行温度和功率相关的PL测量,我们通过积分PL强度与激励功率密度的函数的超线性行为来识别双激子发射通道。相反,中性和带电激子在整个温度范围内显示出线性至亚线性的依赖性。根据双激子和中性激子发射通道之间的能量差,确定了65-70 me V的双激子结合能。

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  • 来源
    《Applied Physics Letters》 |2017年第19期|193102.1-193102.5|共5页
  • 作者单位

    Institute of Electronic Structure and Laser, Foundation for Research and Technology - Hellas, Heraklion 71110, Crete, Greece ,Department of Physics, University of Crete, Heraklion 71003, Crete, Greece;

    Institute of Electronic Structure and Laser, Foundation for Research and Technology - Hellas, Heraklion 71110, Crete, Greece;

    Institute of Electronic Structure and Laser, Foundation for Research and Technology - Hellas, Heraklion 71110, Crete, Greece ,Department of Materials Science and Technology, University of Crete, Heraklion 71003, Crete, Greece;

    Institute of Electronic Structure and Laser, Foundation for Research and Technology - Hellas, Heraklion 71110, Crete, Greece ,Department of Physics, University of Crete, Heraklion 71003, Crete, Greece;

    Institute of Electronic Structure and Laser, Foundation for Research and Technology - Hellas, Heraklion 71110, Crete, Greece ,Center of Materials Technology and Photonics and Electrical Engineering Department, Technological Educational Institute (TEI) of Crete, Heraklion 71004, Crete, Greece;

    Institute of Electronic Structure and Laser, Foundation for Research and Technology - Hellas, Heraklion 71110, Crete, Greece ,Department of Materials Science and Technology, University of Crete, Heraklion 71003, Crete, Greece;

    Institute of Electronic Structure and Laser, Foundation for Research and Technology - Hellas, Heraklion 71110, Crete, Greece ,Department of Materials Science and Technology, University of Crete, Heraklion 71003, Crete, Greece;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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