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Effect of buffer iron doping on delta-doped β-Ga_2O_3 metal semiconductor field effect transistors

机译:缓冲铁掺杂对δ掺杂β-Ga_2O_3金属半导体场效应晶体管的影响

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摘要

We report on the effect of iron (Fe)-doped semi-insulating buffers on the electron transport and DC-RF dispersion in Si delta (delta)-doped beta-Ga2O3 metal-semiconductor field effect transistors. The effect of the distance between the 2-dimensional electron gas and the Fe-doped region was investigated, and Fe doping in the buffer was found to have a significant effect on the transport properties. It was found that buffers thicker than 600 nm can enable better transport and dispersion properties for field effect transistors, while maintaining relatively low parasitic buffer leakage. This work can provide guidance for the use of Fe-doped insulating buffers for future Ga2O3 based electronics. Published by AIP Publishing.
机译:我们报告了铁(Fe)掺杂的半绝缘缓冲液对Siδ(delta)掺杂的beta-Ga2O3金属半导体场效应晶体管中电子传输和DC-RF分散的影响。研究了二维电子气与Fe掺杂区之间的距离的影响,发现缓冲液中的Fe掺杂对传输性能有显着影响。已经发现,厚度大于600 nm的缓冲器可以使场效应晶体管具有更好的传输和色散特性,同时保持相对较低的寄生缓冲器泄漏。这项工作可以为将来基于Ga2O3的电子设备中使用铁掺杂绝缘缓冲液提供指导。由AIP Publishing发布。

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  • 来源
    《Applied Physics Letters》 |2018年第12期|123501.1-123501.4|共4页
  • 作者单位

    Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA;

    Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA;

    Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA;

    Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA;

    Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA;

    Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA;

    Indian Inst Technol, Dept Elect Engn, Bombay 400076, Maharashtra, India;

    Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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  • 入库时间 2022-08-18 03:13:56

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