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Indications of topological transport by universal conductance fluctuations in Bi_2Te_2Se microflakes

机译:Bi_2Te_2Se微片的普遍电导涨落指示拓扑迁移

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Universal conductance fluctuations (UCFs) are extracted in the magnetoresistance responses in bulk-insulating Bi_2Te_2Se microflakes. Their two-dimensional character is demonstrated by field-tilting magnetoresistance measurements. Their origin from the surface electrons is determined by the fact that the UCF amplitudes remain unchanged while applying an in-plane field to suppress the coherence of bulk electrons. After considering the ensemble average in a batch of micrometer-sized samples, the intrinsic UCF magnitude of over 0.37 e~2/h is obtained. This agrees with the theoretical prediction on topological surface states. All the lines of evidence point to the successful observation of the UCF of topological surface states.
机译:在整体绝缘的Bi_2Te_2Se微薄片的磁阻响应中提取了通用电导涨落(UCF)。通过磁场倾斜磁阻测量证明了它们的二维特性。它们源自表面电子的事实是,在施加面内电场以抑制体电子的相干性时,UCF振幅保持不变。在考虑了一批微米级样本的整体平均后,获得的固有UCF幅度超过0.37 e〜2 / h。这与关于拓扑表面状态的理论预测是一致的。所有证据都表明对拓扑表面状态UCF的成功观察。

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  • 来源
    《_Applied Physics Express》 |2014年第6期|065202.1-065202.4|共4页
  • 作者单位

    National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China;

    National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China;

    Department of Physics, Fudan University, Shanghai 200433, P. R. China;

    National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China;

    Department of Physics, Fudan University, Shanghai 200433, P. R. China;

    Department of Physics, Fudan University, Shanghai 200433, P. R. China;

    National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China;

    National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China;

    National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, P. R. China;

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