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首页> 外文期刊>_Applied Physics Express >Dynamical observation of photo-Dember effect on semi-insulating GaAs using femtosecond core-level photoelectron spectroscopy
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Dynamical observation of photo-Dember effect on semi-insulating GaAs using femtosecond core-level photoelectron spectroscopy

机译:飞秒核心级光电子能谱动态观察光-琥珀对半绝缘砷化镓的影响

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We investigated ultrafast photogenerated carrier dynamics on a semi-insulating GaAs surface using femtosecond time-resolved core-level photoelectron spectroscopy. We observed a transient change in the surface potential where the Ga-3d core-level peak instantaneously shifted by ~350 meV toward a higher binding energy within 2 ps of a 100 fs laser irradiation. A comparison of the experimental results with numerical simulations based on a drift-diffusion model of a semi-insulating semiconductor revealed that the transient surface potential change was mainly due to the photo-Dember effect, whereby the large difference in the carrier diffusion between the electron and hole instantaneously induced a surface photovoltage.
机译:我们使用飞秒时间分辨的核能级光电子能谱研究了半绝缘GaAs表面上的超快光生载流子动力学。我们观察到了表面电势的瞬时变化,其中Ga-3d核心能级峰在100 fs激光辐照后2 ps内朝着更高的结合能瞬间偏移了约350 meV。将实验结果与基于半绝缘半导体的漂移扩散模型的数值模拟进行比较,发现瞬态表面电势变化主要归因于光-登伯效应,从而电子之间的载流子扩散差异很大空穴瞬间感应出表面光电压。

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  • 来源
    《_Applied Physics Express 》 |2015年第2期| 022401.1-022401.4| 共4页
  • 作者单位

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan ,Department of Electrical, Electronic and Computer Engineering Faculty of Science and Engineering, Toyo University, Kawagoe, Saitama 350-8585, Japan;

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan ,Department of Electrical and Electronic Engineering, Tokyo Denki University, Adachi, Tokyo 120-8551, Japan;

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan;

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