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Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source

机译:使用极端紫外线高阶谐波源采用飞秒芯级光电子谱研究的半导体表面载体动力学

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We have used a femtosecond time-resolved core-level surface PES system based on the 92-eV harmonic source to study the surface carrier dynamics that induces the transient SPV on semiconductor surfaces. We clarified the temporal evolution of the transient SPV characterized by the time of the photo-generated carrier separation and recombination. This result demonstrates the potential of this technique for clarifying the initial stage of the surface carrier dynamics after photoexcitation.
机译:我们使用了基于92-EV谐波源的飞秒时间分辨的核心级表面PES系统,以研究在半导体表面上引起瞬态SPV的表面载体动态。我们阐明了瞬态SPV的时间演变,其特征在于光产生的载体分离和重组的时间。该结果表明了这种技术的潜力,用于在光透视之后阐明表面载体动力学的初始阶段。

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