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Contact Doping for Vertical Organic Field-Effect Transistors

机译:垂直有机场效应晶体管的接触掺杂

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摘要

Doping is a powerful tool to overcome contact limitations in short-channel organic field-effect transistors (OFETs) and has been successfully used in the past to improve the charge carrier injection in OFETs. The present study applies this familiar concept to the architecture of vertical organic field-effect transistors (VOFETs), which are often severely limited by injection due to their very short channel lengths. The present study shows that the performance of p-type VOFETs with pentacene as an active material can be significantly enhanced by the addition of the common p-dopant C60F36 as a thin injection layer underneath the VOFET source electrode, resulting in an increase of On-state current and On/Off ratio by one order of magnitude. The present study further investigates mixed injection layers of pentacene and the p-dopant and finds that the improvement is less pronounced than for the pure dopant layers and depends on the concentration of dopant molecules in the injection layer. Through application of the transfer length method to equivalent OFET geometries, the present study is finally able to link the observed improvement to a decrease in transfer length and can thus conclude that this length is a crucial parameter onto which further improvement efforts have to be concentrated to realize true short-channel VOFETs.
机译:掺杂是克服短沟道有机场效应晶体管(OFET)接触限制的有力工具,并且过去已成功用于改善OFET中的电荷载流子注入。本研究将这种熟悉的概念应用于垂直有机场效应晶体管(VOFET)的体系结构,由于其非常短的沟道长度,通常受到注入的严格限制。本研究表明,通过在并流层中添加普通的p型掺杂剂C60F36作为薄注入层,可以显着提高并五苯作为活性材料的p型VOFET的性能,从而增加了导通电阻的增加。状态电流和开/关比降低一个数量级。本研究进一步研究了并五苯和p型掺杂剂的混合注入层,发现改进程度不如纯掺杂剂层明显,并且取决于注入层中掺杂剂分子的浓度。通过将转移长度方法应用于等效的OFET几何形状,本研究最终能够将观察到的改善与转移长度的减少联系起来,因此可以得出结论,该长度是至关重要的参数,必须将重点放在进一步改进上实现真正的短通道VOFET。

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