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Atomic Layer Deposition of Tin Monosulfide Thin Films

机译:单硫化锡薄膜的原子层沉积

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Thin film solar cells made from earth-abundant, non-toxic materials are needed to replace the current technology that uses Cu(In,Ga)(S,Se)2 and CdTe, which contain scarce and toxic elements. One promising candidate absorber material is tin monosulfide (SnS). In this report, pure, stoichiometric, single-phase SnS films were obtained by atomic layer deposition (ALD) using the reaction of bis(N,N′-diisopropylacetamidinato)tin(II) [Sn(MeC(N-iPr)2)2] and hydrogen sulfide (H2S) at low temperatures (100 to 200 °C). The direct optical band gap of SnS is around 1.3 eV and strong optical absorption ( > 104 cm−1) is observed throughout the visible and near-infrared spectral regions. The films are p-type semiconductors with carrier concentration on the order of 1016 cm−3 and hole mobility 0.82–15.3 cm2V−1s−1 in the plane of the films. The electrical properties are anisotropic, with three times higher mobility in the direction through the film, compared to the in-plane direction.
机译:需要使用由地球上丰富的无毒材料制成的薄膜太阳能电池来替代使用含稀有毒元素的Cu(In,Ga)(S,Se)2和CdTe的当前技术。一种有希望的候选吸收材料是单硫化锡(SnS)。在此报告中,使用双(N,N'-二异丙基乙酰胺基氨基)锡(II)[Sn(MeC(N-iPr)2)反应,通过原子层沉积(ALD)获得了纯的,化学计量的单相SnS膜。 2]和硫化氢(H2S)在低温下(100至200°C)。 SnS的直接光学带隙约为1.3 eV,并且在整个可见光和近红外光谱区域均观察到强光吸收(> 104 cm-1)。薄膜是p型半导体,载流子浓度在薄膜平面中约为1016 cm-3,空穴迁移率为0.82-15.3 cm2V-1s-1。电特性是各向异性的,在穿过薄膜的方向上的迁移率是平面内方向的三倍。

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