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In Situ Doping of Nitrogen in 110-Oriented Bulk 3C-SiC by Halide Laser Chemical Vapour Deposition

机译:卤化物激光化学气相沉积法在110取向块状3C-SiC中原位掺杂氮

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摘要

Doping of nitrogen is a promising approach to improve the electrical conductivity of 3C-SiC and allow its application in various fields. N-doped, <110>-oriented 3C-SiC bulks with different doping concentrations were prepared via halide laser chemical vapour deposition (HLCVD) using tetrachlorosilane (SiCl ) and methane (CH ) as precursors, along with nitrogen (N ) as a dopant. We investigated the effect of the volume fraction of nitrogen ( ) on the preferred orientation, microstructure, electrical conductivity ( ), deposition rate ( ), and optical transmittance. The preference of 3C-SiC for the <110> orientation increased with increasing . The value of the N-doped 3C-SiC bulk substrates first increased and then decreased with increasing , reaching a maximum value of 7.4 × 10 S/m at = 20%. showed its highest value (3000 μm/h) for the undoped sample and decreased with increasing , reaching 1437 μm/h at = 30%. The transmittance of the N-doped 3C-SiC bulks decreased with and showed a declining trend at wavelengths longer than 1000 nm. Compared with the previously prepared <111>-oriented N-doped 3C-SiC, the high-speed preparation of <110>-oriented N-doped 3C-SiC bulks further broadens its application field.
机译:掺杂氮是改善3C-SiC的电导率并允许其在各种领域中应用的有前途的方法。通过卤化物激光化学气相沉积(HLCVD),以四氯硅烷(SiCl)和甲烷(CH)为前体,以及氮(N)作为掺杂剂,制备了具有不同掺杂浓度的N掺杂,<110>取向的3C-SiC块体。我们研究了氮的体积分数()对首选取向,微观结构,电导率(),沉积速率()和透光率的影响。 3C-SiC对<110>取向的偏爱随着增加而增加。掺N的3C-SiC块状衬底的值先增大后减小,在= 20%时达到最大值7.4×10 S / m。对于未掺杂样品,其最高值(3000μm/ h)随增加而降低,在= 30%时达到1437μm/ h。 N掺杂的3C-SiC块体的透射率随波长的增加而下降,并且在大于1000 nm的波长处显示出下降的趋势。与先前制备的<111>取向的N掺杂3C-SiC块体相比,<110>取向的N掺杂的3C-SiC块体的高速制备进一步拓宽了其应用领域。

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