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Room-temperature Domain-epitaxy of Copper Iodide Thin Films for Transparent CuI/ZnO Heterojunctions with High Rectification Ratios Larger than 109

机译:高整流比大于109的透明CuI / ZnO异质结的碘化铜薄膜的室温畴外延

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摘要

CuI is a p-type transparent conductive semiconductor with unique optoelectronic properties, including wide band gap (3.1 eV), high hole mobility (>40 cm2 V−1 s−1 in bulk), and large room-temperature exciton binding energy (62 meV). The difficulty in epitaxy of CuI is the main obstacle for its application in advanced solid-state electronic devices. Herein, room-temperature heteroepitaxial growth of CuI on various substrates with well-defined in-plane epitaxial relations is realized by reactive sputtering technique. In such heteroepitaxial growth the formation of rotation domains is observed and hereby systematically investigated in accordance with existing theoretical study of domain-epitaxy. The controllable epitaxy of CuI thin films allows for the combination of p-type CuI with suitable n-type semiconductors with the purpose to fabricate epitaxial thin film heterojunctions. Such heterostructures have superior properties to structures without or with weakly ordered in-plane orientation. The obtained epitaxial thin film heterojunction of p-CuI(111)-ZnO(00.1) exhibits a high rectification up to 2 × 109 (±2 V), a 100-fold improvement compared to diodes with disordered interfaces. Also a low saturation current density down to 5 × 10−9 Acm−2 is formed. These results prove the great potential of epitaxial CuI as a promising p-type optoelectronic material.
机译:CuI是具有独特的光电特性的p型透明导电半导体,具有宽带隙(3.1 eV),高空穴迁移率(> 40 cm 2 V -1 s < sup> -1 )和大的室温激子结合能(62 meV)。 CuI的外延困难是其在高级固态电子设备中应用的主要障碍。在此,通过反应溅射技术实现了在具有明确的面内外延关系的各种基板上的CuI的室温异质外延生长。在这种异质外延生长中,观察到旋转域的形成,并根据现有的域外延理论研究系统地对其进行了研究。 CuI薄膜的可控外延允许将p型CuI与合适的n型半导体相结合,以制造外延薄膜异质结。这样的异质结构比没有或具有弱有序的面内取向的结构具有优良的性能。所获得的p-CuI(111)/ n-ZnO(00.1)的外延薄膜异质结显示出高达2×10 9 (±2 V)的高整流度,与之相比提高了100倍。接口杂乱的二极管。还形成低至5 saturation×10 -9 Acm -2 的低饱和电流密度。这些结果证明了外延CuI作为有希望的p型光电材料的巨大潜力。

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