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Investigation of dose-rate effects and cell-cycle distribution under protracted exposure to ionizing radiation for various dose-rates

机译:在各种剂量率下长时间暴露于电离辐射下的剂量率效应和细胞周期分布的研究

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摘要

During exposure to ionizing radiation, sub-lethal damage repair (SLDR) competes with DNA damage induction in cultured cells. By virtue of SLDR, cell survival increases with decrease of dose-rate, so-called dose-rate effects (DREs). Here, we focused on a wide dose-rate range and investigated the change of cell-cycle distribution during X-ray protracted exposure and dose-response curves via hybrid analysis with a combination of in vitro experiments and mathematical modelling. In the course of flow-cytometric cell-cycle analysis and clonogenic assays, we found the following responses in CHO-K1 cells: (1) The fraction of cells in S phase gradually increases during 6 h exposure at 3.0 Gy/h, which leads to radio-resistance. (2) Slight cell accumulation in S and G2/M phases is observed after exposure at 6.0 Gy/h for more than 10 hours. This suggests that an increase of SLDR rate for cells in S phase during irradiation may be a reproducible factor to describe changes in the dose-response curve at dose-rates of 3.0 and 6.0 Gy/h. By re-evaluating cell survival for various dose-rates of 0.186–60.0 Gy/h considering experimental-based DNA content and SLDR, it is suggested that the change of S phase fraction during irradiation modulates the dose-response curve and is possibly responsible for some inverse DREs.
机译:在暴露于电离辐射期间,亚致死损伤修复(SLDR)与培养细胞中的DNA损伤诱导竞争。通过SLDR,细胞存活率随着剂量率(所谓的剂量率效应(DRE))的降低而增加。在这里,我们专注于较宽的剂量率范围,并通过结合体外实验和数学建模的混合分析,研究了X线长时间曝光和剂量-反应曲线期间细胞周期分布的变化。在流式细胞仪细胞周期分析和克隆形成测定的过程中,我们发现CHO-K1细胞具有以下反应:(1)在以3.0 Gy / h暴露6h的过程中,S期细胞比例逐渐增加。耐无线电性。 (2)在以6.0 Gy / h的速度暴露10多个小时后,观察到S和G2 / M期细胞有少量积累。这表明在辐照期间S期细胞SLDR速率的增加可能是描述剂量-响应曲线在剂量率为3.0和6.0yGy / h时变化的可再现因素。考虑到基于实验的DNA含量和SLDR,通过重新评估0.186–60.0 Gy / h的各种剂量率下的细胞存活率,表明照射过程中S相分数的变化可调节剂量反应曲线,并可能是导致一些逆DRE。

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