不同偏置下10位双极模数转换器高低剂量率的辐射效应

摘要

研究了10位双极模数转换器( ADC)在60Coγ射线不同剂量率、不同偏置条件辐照下的电离辐射效应及退火特性.研究结果发现,此类模数混合信号电路在不同偏置和不同剂量率辐照下的电离辐照响应有较大差异.同一电参数既表现出低剂量率损伤增强效应(ELDRS)又表现出时间相关效应(TDE).研究结果进一步表明,低剂量率辐照0V偏置是最劣偏置;与之相反,高剂量率辐照5V偏置是最劣偏置,而加电阻偏置对辐照损伤有一定的抑制作用.最后,结合空间电荷模型和边缘电场效应对其辐照损伤差异及退火机理进行了初步探讨.%Total - irradiation - dose effect and room - temperature annealing behavior of a 10 - bit bipolar analog -to -digital converter (ADC) irradiated by 60Caγ -rays were investigated under different dose rates and bias conditions. The results show that the response of this kind of ADC circuit is very different under different conditions. The same electric parameters showed both enhanced low - dose - rate sensitivity effect ( ELDRS) and time dependence effect (TDE). The further results show that 0V bias is the worst bias under low dose rate, while 5 V bias is the worst under high dose rate. And the bias with the output terminal grounded via resistance has certain inhibition on the radiation damage. Finally, based on the space charge model and the fringing field effect, the differences of radiation damage and possible annealing mechanism was discussed.