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Non-Contact Surface Roughness Measurement by Implementation of a Spatial Light Modulator

机译:通过空间光调制器实现非接触表面粗糙度测量

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摘要

The surface structure, especially the roughness, has a significant influence on numerous parameters, such as friction and wear, and therefore estimates the quality of technical systems. In the last decades, a broad variety of surface roughness measurement methods were developed. A destructive measurement procedure or the lack of feasibility of online monitoring are the crucial drawbacks of most of these methods. This article proposes a new non-contact method for measuring the surface roughness that is straightforward to implement and easy to extend to online monitoring processes. The key element is a liquid-crystal-based spatial light modulator, integrated in an interferometric setup. By varying the imprinted phase of the modulator, a correlation between the imprinted phase and the fringe visibility of an interferogram is measured, and the surface roughness can be derived. This paper presents the theoretical approach of the method and first simulation and experimental results for a set of surface roughnesses. The experimental results are compared with values obtained by an atomic force microscope and a stylus profiler.
机译:表面结构,尤其是粗糙度,对许多参数(例如摩擦和磨损)具有重大影响,因此可以估算技术系统的质量。在过去的几十年中,开发了各种各样的表面粗糙度测量方法。破坏性的测量程序或缺乏在线监视的可行性是大多数这些方法的关键缺点。本文提出了一种新的用于测量表面粗糙度的非接触式方法,该方法易于实现且易于扩展到在线监视过程。关键元件是集成在干涉仪中的基于液晶的空间光调制器。通过改变调制器的压印相位,可以测量压印相位和干涉图的条纹可见度之间的相关性,并且可以得出表面粗糙度。本文介绍了该方法的理论方法以及一组表面粗糙度的首次仿真和实验结果。将实验结果与通过原子力显微镜和测针轮廓仪获得的值进行比较。

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