首页> 美国卫生研究院文献>Sensors (Basel Switzerland) >An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT
【2h】

An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT

机译:消除充电现象对ECT影响的AST-ELM方法

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Electrical capacitance tomography (ECT) is a promising imaging technology of permittivity distributions in multiphase flow. To reduce the effect of charging phenomenon on ECT measurement, an improved extreme learning machine method combined with adaptive soft-thresholding (AST-ELM) is presented and studied for image reconstruction. This method can provide a nonlinear mapping model between the capacitance values and medium distributions by using machine learning but not an electromagnetic-sensitive mechanism. Both simulation and experimental tests are carried out to validate the performance of the presented method, and reconstructed images are evaluated by relative error and correlation coefficient. The results have illustrated that the image reconstruction accuracy by the proposed AST-ELM method has greatly improved than that by the conventional methods under the condition with charging object.
机译:电容层析成像(ECT)是一种有前途的多相流介电常数分布成像技术。为了减少充电现象对ECT测量的影响,提出了一种结合自适应软阈值(AST-ELM)的改进的极限学习机方法,并对其进行了图像重建研究。该方法可以通过使用机器学习而不是电磁敏感机制来提供电容值和介质分布之间的非线性映射模型。进行了仿真和实验测试以验证所提出方法的性能,并通过相对误差和相关系数评估重建的图像。结果表明,在带电物体的条件下,所提出的AST-ELM方法的图像重建精度大大高于传统方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号