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Determination of band offsets hybridization and exciton binding in 2D semiconductor heterostructures

机译:确定二维半导体异质结构中的带偏移杂交和激子结合

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摘要

Combining monolayers of different two-dimensional semiconductors into heterostructures creates new phenomena and device possibilities. Understanding and exploiting these phenomena hinge on knowing the electronic structure and the properties of interlayer excitations. We determine the key unknown parameters in MoSe2/WSe2 heterobilayers by using rational device design and submicrometer angle-resolved photoemission spectroscopy (μ-ARPES) in combination with photoluminescence. We find that the bands in the K-point valleys are weakly hybridized, with a valence band offset of 300 meV, implying type II band alignment. We deduce that the binding energy of interlayer excitons is more than 200 meV, an order of magnitude higher than that in analogous GaAs structures. Hybridization strongly modifies the bands at Γ, but the valence band edge remains at the K points. We also find that the spectrum of a rotationally aligned heterobilayer reflects a mixture of commensurate and incommensurate domains. These results directly answer many outstanding questions about the electronic nature of MoSe2/WSe2 heterobilayers and demonstrate a practical approach for high spectral resolution in ARPES of device-scale structures.
机译:将不同的二维半导体的单层结合到异质结构中会产生新的现象和器件可能性。了解和利用这些现象取决于了解层间激发的电子结构和性质。我们使用合理的器件设计和亚微米角度分辨光发射光谱(μ-ARPES)结合光致发光,确定了MoSe2 / WSe2异质双分子层中的关键未知参数。我们发现,K点谷中的谱带是弱杂交的,价带偏移为300 meV,这意味着II型谱带对齐。我们推论层间激子的结合能大于200 meV,比类似的GaAs结构要高一个数量级。杂交强烈修饰了Γ处的能带,但价带边缘仍保留在K点。我们还发现,旋转排列的异质双分子层的光谱反映了相称域和不相称域的混合。这些结果直接回答了有关MoSe2 / WSe2异质双层电子性质的许多悬而未决的问题,并证明了在器件级结构的ARPES中实现高光谱分辨率的实用方法。

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