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The inconsistent distribution of introns in the T-even phages indicates recent genetic exchanges.

机译:T-even噬菌体中内含子的不一致分布表明最近的遗传交换。

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摘要

Group I self-splicing introns are present in the td, nrdB and sunY genes of bacteriophage T4. We previously reported that whereas the td intron is present in T2, T4 and T6, the nrdB intron is present in T4 only. These studies, which argue in favor of introns as mobile genetic elements, have been extended by defining the distribution of all three T4 introns in a more comprehensive collection of T2, T4 and T6 isolates. The three major findings are as follows: First, all three introns are inconsistently distributed throughout the T-even phage family. Second, different T2 isolates have different intron complements, with T2H and T2L having no detectable introns. Third, the intron open reading frames are inherited or lost as a unit with their respective flanking intron core elements. Furthermore, exon sequences flanking sites where introns are inserted in the T4 td, sunY and nrdB genes were determined for all the different T-even isolates studied. Six of eighteen residues surrounding the junction sequences are identical. In contrast, a comprehensive comparison of exon sequences in intron plus and intron minus variants of the sunY gene indicate that sequence changes are concentrated around the site of intron occurrence. This apparent paradox may be resolved by hypothesizing that the recombination events responsible for intron acquisition or loss require a consensus sequence, while these same events result in sequence heterogeneity around the site.
机译:噬菌体T4的td,nrdB和sunY基因中存在I类自剪接内含子。我们之前曾报道说,虽然Td内含子存在于T2,T4和T6中,但是nrdB内含子仅存在于T4中。这些研究主张将内含子作为可移动的遗传元件,并通过在更全面的T2,T4和T6分离株集合中定义所有三个T4内含子的分布而得到扩展。三个主要发现如下:首先,所有三个内含子在整个T-even噬菌体家族中分布不一致。其次,不同的T2分离株具有不同的内含子互补序列,T2H和T2L没有可检测的内含子。第三,内含子开放阅读框与它们各自的侧翼内含子核心元件作为一个单元被继承或丢失。此外,对于研究的所有不同的T-even分离株,确定了将内含子插入T4 td,sunY和nrdB基因的外显子序列侧翼位点。连接序列周围的十八个残基中有六个是相同的。相反,对sunY基因的内含子加号和内含子减号变体中外显子序列的全面比较表明,序列变化集中在内含子发生位点附近。这种明显的矛盾可以通过假设负责内含子获取或丢失的重组事件需要一个共有序列来解决,而这些相同的事件导致该位点周围的序列异质性。

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