针对"多塔"结构的3D堆叠集成电路(3D-SIC)测试耗时很长的问题,提出一种基于量子粒子群优化的测试调度方法,以缩短测试时间.首先,构造初始粒子群用以表示初始可行解,产生具有量子行为的新粒子,并更新粒子群;然后进行粒子群的迭代进化以获取全局最优解.最小化"终堆"测试时间和集成过程总测试的调度结果均表明,该方法可显著地缩短测试时间;当复杂晶片集成在3D-SIC底层时,"终堆"测试时间较短,而集成过程的总测试时间较长.%Multi-tower three dimensional stacked integrated circuits (3D-SIC) have a prolonged test time. This work proposes a test scheduling method of 3D-SIC based on quantum-behaved particle swarm optimi-zation (QPSO) to reduce the test time. Firstly, it constructs an initial particle swarm that represents the fea-sible solutions; then it generates the new quantum-behaved particle and updates the particle swarm based on the fitness values and the constraints; finally, it approximates the optimal scheduling solution till the end of the swarm evolution. The experimental results on the final stack and the integration process show that this method reduces the test time of 3D-SIC obviously. The test time is shorter for the stacked final 3D-SIC, and vice versa for the 3D-SIC integration process, if the complex die is integrated as the bottom die.
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