首页> 外文学位 >Advanced processing techniques for aluminum gallium nitride/gallium nitride high electron mobility transistors.
【24h】

Advanced processing techniques for aluminum gallium nitride/gallium nitride high electron mobility transistors.

机译:氮化铝镓/氮化镓高电子迁移率晶体管的先进处理技术。

获取原文
获取原文并翻译 | 示例

摘要

In this dissertation, we have taken an experimental approach to address the main challenges for the use of AlGaN/GaN high electron mobility transistors at millimeter-wave frequencies. Innovative implementation of materials, advanced design techniques and novel processing steps have been employed to overcome the obstacles.;The high frequency performance of these devices is severely limited by parasitic capacitances and access resistances. To minimize the parasitics, we have developed a self-aligned submicron technology where the source and drain regions are self-aligned to the gate. To facilitate this approach, high performance and low temperature annealed ohmic contacts have been developed. The self-aligned technology enabled minimizing the access resistance by reducing the source to drain distance. A nitride based gate transfer technology has been employed to realize high aspect ratio. High performance self-aligned devices with fT 92 GHz and fmax 104 GHz have been realized for the first time. Processing innovations demonstrating the potential to improve device performance have been discussed. A comprehensive study of the low temperature ohmic contact that enables the self-aligned technology has been performed, and an optimized metallization scheme has been identified for high performance and reliability.;A major limitation of AlGaN/GaN transistor technology is the difficulty to achieve normally-off devices. Nonrecessed enhancement mode (normally-off) devices using fluorine plasma pretreatment of the gate region have been fabricated in submicron technology for the first time. An improvement of device performance has been realized by employing the self-aligned technology on these enhancement mode devices. An fT and an fmax of 30 GHz and 52 GHz, respectively, have been demonstrated.;A comprehensive study of the effects of fluorine plasma treatment on the gate leakage and two-dimensional electron gas transport properties has been carried out to obtain insights into the passivation mechanisms of fluorine, and to be able to apply these to optimize device performance.;Using all the processing advancements demonstrated through the research undertaken in this dissertation highlights the potential of GaN-based transistors for next generation millimeter-wave applications, and possibly digital applications.
机译:在本文中,我们采用了一种实验方法来解决毫米波频率下使用AlGaN / GaN高电子迁移率晶体管的主要挑战。材料的创新实施,先进的设计技术和新颖的处理步骤已被用来克服这些障碍。这些设备的高频性能受到寄生电容和访问电阻的严重限制。为了使寄生效应最小化,我们开发了一种自对准亚微米技术,其中源极和漏极区域与栅极自对准。为了促进这种方法,已经开发了高性能和低温退火的欧姆接触。自对准技术可通过减小源极到漏极的距离来最小化访问电阻。已经采用基于氮化物的栅极转移技术来实现高纵横比。首次实现了fT 92 GHz和fmax 104 GHz的高性能自对准器件。已经讨论了显示出改善设备性能潜力的处理创新。已经对能够实现自对准技术的低温欧姆接触进行了全面研究,并确定了具有高性能和可靠性的优化金属化方案。; AlGaN / GaN晶体管技术的主要局限在于难以正常实现关设备。使用亚微米技术对栅极区域进行氟等离子体预处理的非凹进增强模式(常关)器件是首次采用亚微米技术制造。通过在这些增强模式设备上采用自对准技术,已经实现了设备性能的提高。已经证明了fT和fmax分别为30 GHz和52 GHz。;对氟等离子体处理对栅极泄漏和二维电子气传输特性的影响进行了全面研究,以了解氟的钝化机制,并能够应用这些机制来优化器件性能。;利用本论文研究中展示的所有工艺进步,凸显了GaN基晶体管在下一代毫米波应用中的潜力,甚至可能在数字化方面应用程序。

著录项

  • 作者

    Basu, Anirban.;

  • 作者单位

    University of Illinois at Urbana-Champaign.;

  • 授予单位 University of Illinois at Urbana-Champaign.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2009
  • 页码 186 p.
  • 总页数 186
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号