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Accurate and efficient assessment of the impact of interconnect variations on CMOS IC timing performance.

机译:准确有效地评估互连变化对CMOS IC时序性能的影响。

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摘要

With CMOS technologies marching into very deep sub-micron region, the manufacturing variations are becoming an important issue in both design and yield improvement. Unlike device variations, whose impact on circuit timing can be captured by worst-case comer point methods, the impact of interconnect variations is context-dependent. Physical design details have to be taken into account if an accurate estimation on the impact of the variations is needed. However, at this stage, the overwhelming data volume and the complicated physical phenomena make the existing methods either inaccurate or inefficient. In this dissertation, we propose a novel deterministic variational order-reduction method. By combining the state-of-the-art interconnect order-reduction techniques and matrix perturbation theory, the method generates a reduced-order model with direct inclusion of the manufacturing variations. By applying this method, the impact of some key statistically-independent process variations, which have the most significant systematic effects on timing performance, can be analyzed in a more realistic, context-dependent manner.; To demonstrate the application of this analysis methods, as well as the effects of the interconnect variations on the IC timing performance, the impact of interconnect variations on the clock skew in a leading-edge industrial design is analyzed. The results show that the interconnect variations alone can cause up to 25% variation in the clock skew, which might be a significant problem for the circuit performance.; With the application of variational reduced-order model, another important issue for statistical analysis is the efficient simulation of the interconnect models. Because the reduced-order models are mostly in frequency domain, a frequency-to-time domain conversion is needed in order to incorporate the model into a timing simulator. In this dissertation, we also propose a frequency-to-time domain method which can achieve the highest possible accuracy under the piece-wise linear waveform assumption while maintaining high efficiency. Moreover, we propose a method to expedite the simulation of RC interconnect model by sparsifying the time domain stencil. Such a method is useful for interconnect networks with large number of ports, such as a clock tree.
机译:随着CMOS技术进入非常深的亚微米区域,制造差异正成为设计和成品率提高方面的重要问题。与器件变体不同,其对电路时序的影响可以通过最坏情况的拐点方法来捕获,而互连变体的影响则取决于上下文。如果需要对变化的影响进行准确的估算,则必须考虑物理设计细节。但是,在此阶段,庞大的数据量和复杂的物理现象使现有方法不准确或效率低下。本文提出了一种新颖的确定性变分阶降阶方法。通过结合最新的互连降阶技术和矩阵扰动理论,该方法生成了直接包含制造差异的降阶模型。通过应用这种方法,可以以更实际的,与上下文相关的方式来分析一些关键的与统计无关的过程变化的影响,这些变化对计时性能具有最重大的系统影响。为了演示这种分析方法的应用以及互连变化对IC时序性能的影响,分析了前沿工业设计中互连变化对时钟偏斜的影响。结果表明,仅互连的变化会导致时钟偏差的变化高达25%,这可能是电路性能的重大问题。随着变分降阶模型的应用,统计分析的另一个重要问题是互连模型的有效仿真。由于降阶模型主要在频域中,因此需要进行频域到时域转换,以将模型合并到时序模拟器中。本文还提出了一种频域-时域方法,该方法在保持分段线性波形假设的前提下,能够保持较高的效率,同时又能达到最高的精度。此外,我们提出了一种通过稀疏时域模板来加速RC互连模型仿真的方法。这样的方法对于具有大量端口的互连网络(例如时钟树)很有用。

著录项

  • 作者

    Liu, Ying.;

  • 作者单位

    Carnegie Mellon University.;

  • 授予单位 Carnegie Mellon University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 1999
  • 页码 108 p.
  • 总页数 108
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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