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Modeling of Failure Mechanism and Life Prediction of Lead-Free BGA Solder Joint under Repetitive Mechanical Drop Loading.

机译:重复机械跌落载荷作用下无铅BGA焊点失效机理的建模和寿命预测。

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摘要

With the recent development of mobile consumer electronics, a unique set of reliability issues those are associated with portable products and their using environment. In particular, accidental dropping is believed to cause substantial damage to the solder joints. The increasing occurrence of drop failure of portable electronics has been traced to the failure of the solder joints that interconnect the integrated circuit (IC) components with the printed circuit board (PCB). The increasing market pressure to replace lead based solder in electronic products has resulted in research being carried out in many areas related to lead-free solder. Thus, the reliability of lead-free solder joints under mechanical shock loading is a major concern.;The main objective of this thesis is to study the failure mechanism and life prediction for lead-free ball grid array (BGA) solder joint subject to repetitive mechanical drop loading. The emphasis will be placed on the strain hardening effect of lead-free solder joint under repetitive mechanical drop loading.;The mechanical properties of SAC lead-free solder alloy were first studied by the tensile test. The results showed that the SAC lead-free solder was strongly strain rate dependent. The constitutive model of SAC lead-free solder was built. Nanoindentation tests were employed to obtain the mechanical properties of lead-free solder and IMC. The nanoindentation hardness value for SAC lead-free solder and IMC was found to decrease with increasing aging time. The IMC layers grew in thickness during thermal aging tests, while there were no significant changes in the Young’s modulus of IMC.;High speed ball pull tests were used to find the brittle fracture strength of IMC. The simulation of the high speed ball pull tests were studied and correlated with the high speed ball pull tests. Then the IMC brittle failure criterion was established.;The strain hardening effects of SAC lead-free solder were found by solder wire drop test and board level drop test (BLDT). The structure stiffening effects were also found by the strain measurement during the BLDT experiment. The failure analysis after the PCBA BLDT experiment showed that all the failure modes were brittle failures. A 3D finite element model of the PCBA was built and studied under repetitive drop loading. The dominant strain rates of the SAC lead-free solder joints were found by correlating the material properties with tensile tests. After gradually correlating the drop loading condition, PCB strain, failure location and mode, and the IMC strain rates, the drop to failure number under repetitive drop loading was found. The predicted life from the simulation model matched well with the BLDT experiments. Finally this simulation model was validated on the industrial PBGA BLDT.
机译:随着移动消费电子产品的最新发展,与便携式产品及其使用环境相关的一系列独特的可靠性问题。特别是,意外掉落被认为会对焊点造成实质性损害。便携式电子产品跌落故障的发生率越来越高,可以追溯到使集成电路(IC)组件与印刷电路板(PCB)互连的焊接点的故障。替代电子产品中基于铅的焊料的市场压力越来越大,导致人们在与无铅焊料有关的许多领域进行了研究。因此,无铅焊点在机械冲击载荷下的可靠性是一个主要的问题。本论文的主要目的是研究无铅球栅阵列(BGA)焊头在重复性作用下的失效机理和寿命预测。机械降落载荷。重点将放在重复的机械滴加载荷下无铅焊点的应变硬化效果。;首先通过拉伸试验研究了SAC无铅焊锡合金的力学性能。结果表明,SAC无铅焊料强烈依赖应变率。建立了SAC无铅焊料的本构模型。纳米压痕测试用于获得无铅焊料和IMC的机械性能。发现SAC无铅焊料和IMC的纳米压痕硬度值随老化时间的增加而降低。在热老化试验中,IMC层的厚度增加,而IMC的杨氏模量没有显着变化。;高速球拉试验用于发现IMC的脆性断裂强度。研究了高速球拉力测试的仿真并将其与高速球拉力测试相关联。然后建立了IMC脆性破坏准则。通过焊锡丝跌落试验和板级跌落试验(BLDT)发现了SAC无铅焊料的应变硬化效果。通过在BLDT实验期间的应变测量也发现了结构的加强效果。 PCBA BLDT实验后的失效分析表明,所有失效模式均为脆性失效。建立了PCBA的3D有限元模型,并在反复的液滴载荷下对其进行了研究。 SAC无铅焊点的主要应变速率是通过将材料性能与拉伸试验相关联而得出的。在逐渐将跌落载荷条件,PCB应变,失效位置和模式以及IMC应变率相关联之后,发现在反复跌落载荷下跌落至失效次数。仿真模型的预测寿命与BLDT实验非常吻合。最后,该仿真模型在工业PBGA BLDT上得到了验证。

著录项

  • 作者

    Jiang, Tong.;

  • 作者单位

    Hong Kong University of Science and Technology (Hong Kong).;

  • 授予单位 Hong Kong University of Science and Technology (Hong Kong).;
  • 学科 Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2012
  • 页码 173 p.
  • 总页数 173
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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