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The role of additives on direct copper electrodeposition on barriers.

机译:添加剂对直接在阻挡层上电沉积铜的作用。

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摘要

The impact of bath composition and additives on copper nucleation on barrier materials was investigated. The effect of bath composition and additives on the initial stages of copper electrodeposition onto Ru substrates is presented in chapter 2. Surface pretreatment on Ru surface enhances the adhesion between Cu and Ru. The impact of additives and bulk cupric sulfate concentration is reported for both potentiostatic and galvanostatic operation. The presence of chloride ions and polyethylene glycol (PEG) leads to an increase of particle density, while bis (3-sulfopropyl) disulfide (SPS) leads to a decrease in particle density.;Numerical simulations are used to study the electrochemical nucleation and growth on barrier materials, and results are presented in chapter 3. The impact of reactant depletion on nucleation rate is considered by introduction of a concentration-dependent rate law. The effect is only important for progressive nucleation, when nucleation rates are comparable to or slower than the growth rate. For instantaneous nucleation, the impact of surface concentration depletion was not essential, because copper nucleation occurs before surface depletion is significant. A concentration-dependent nucleation rate may have a relatively small impact on the predicted current transient, but may have a significant: effect on particle density and size distribution.;The influence of the bulk concentration of cupric sulfate on copper nucleation on Ti and Ta was investigated, and results are presented in chapter 4. Both chronoamperometry and SEM suggest that an increase in bulk concentration cause an increase of particle density in dilute electrolyte, while the particle density does not increase with increasing concentration in the higher concentration range. The bulk concentration cupric sulfate is observed to have a significant impact on current transients. Results of pulsed electrodeposition are also shown, and simulation results get qualitatively agreement with experimental results.;Results for the electrochemical nucleation of Cu on Ru, Ta and glassy carbon are given in chapter 5. Additives are observed to have an impact on the microstructure of the copper film deposited on barrier materials. Similar trends are seen on Ru, Ta and glassy carbon. The presence of chloride ions (Cl-) and PEG increases the particle density minimally. The addition of SPS decreases particle density and increases particle size when results are compared at the same potential, and its acceleration effect still exists after copper coalesced on Ru. The behavior of additives also remains the same in both dilute electrolyte and concentrated electrolyte. The impact of additives on particle density is observed to be signifcant on Ru than on Ta and glassy carbon.
机译:研究了镀液组成和添加剂对阻隔材料上铜成核的影响。第2章介绍了镀液组成和添加剂对在Ru基体上电沉积铜的初始阶段的影响。Ru表面的表面预处理可增强Cu和Ru之间的附着力。据报道,在恒电位和恒电流操作中,添加剂和总硫酸铜浓度的影响。氯离子和聚乙二醇(PEG)的存在导致颗粒密度增加,而双(3-磺丙基)二硫化物(SPS)导致颗粒密度降低。;使用数值模拟研究了电化学成核和生长关于阻隔材料的研究结果,将在第3章中介绍。通过引入浓度依赖性速率定律,可以考虑反应物耗竭对成核速率的影响。当成核速率与生长速率相当或比其慢时,该作用仅对于渐进形核很重要。对于瞬时成核,表面浓度耗尽的影响不是必需的,因为铜成核发生在表面耗尽明显之前。浓度依赖性成核速率可能对预测的电流瞬变影响相对较小,但可能具有显着影响:对颗粒密度和尺寸分布的影响。硫酸铜的总体浓度对铜和铜成核对Ti和Ta的影响为电流安培法和扫描电镜均表明,体积浓度的增加会导致稀电解质颗粒密度的增加,而在较高浓度范围内,颗粒密度不会随浓度的增加而增加。观察到总浓度的硫酸铜对电流瞬变具有显着影响。还显示了脉冲电沉积的结果,并且模拟结果与实验结果在质量上吻合。;第5章给出了Cu在Ru,Ta和玻璃碳上的电化学成核结果。观察到添加剂会影响Cu的微观结构。沉积在阻隔材料上的铜膜。钌,钽和玻璃碳也有类似趋势。氯离子(Cl-)和PEG的存在最小程度地增加了颗粒密度。当在相同电势下比较结果时,SPS的添加会降低颗粒密度并增加粒径,并且在铜与Ru结合后,其加速作用仍然存在。添加剂的行为在稀电解质和浓电解质中也保持相同。观察到,添加剂对颗粒密度的影响对Ru的影响比对Ta和玻璃碳的影响大。

著录项

  • 作者

    Zheng, Min.;

  • 作者单位

    Columbia University.;

  • 授予单位 Columbia University.;
  • 学科 Engineering Chemical.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 129 p.
  • 总页数 129
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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