Department of Material and Life Science, Graduate School of Engineering, Osaka University 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan;
Department of Material and Life Science, Graduate School of Engineering, Osaka University 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan;
Department of Material and Life Science, Graduate School of Engineering, Osaka University 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan;
Department of Material and Life Science, Graduate School of Engineering, Osaka University 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan;
Department of Material and Life Science, Graduate School of Engineering, Osaka University 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan;
Department of Material and Life Science, Graduate School of Engineering, Osaka University 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan;
germanium; MOS; gate dielectric; oxynitride; plasma nitridation;
机译:通过在Ge(100)上对超薄热氧化物进行等离子体氮化形成的氮氧化锗栅极电介质
机译:钛铝氧化物超薄膜作为高k栅极介电材料的热稳定性和电性能
机译:使用超薄GeSnO_x膜作为表面钝化层的具有HfO_2栅极电介质的Ge金属氧化物半导体器件的改进电性能
机译:通过在Ge(100)上对超薄热氧化物进行等离子体氮化形成的高质量GeON栅极电介质
机译:用于金属氧化物半导体栅极介电应用的二氧化硅远程等离子体氮化研究。
机译:超薄Hf-Ti-O高k栅介电薄膜的电学特性及其在ETSOI MOSFET中的应用
机译:具有超薄等离子体 - 氮化SiON电介质的P沟道金属氧化物半导体场效应晶体管负偏置温度不稳定性下的界面阱和氧化物电荷产生
机译:二氧化硅热氮化制备薄氧氮化物栅介质的性能