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Performance of 64×64 MWIR Supper lattice Light Emitting Diode (SLED) array for IRscene generation

机译:用于红外场景的64×64 MWIR超晶格发光二极管(SLED)阵列的性能

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We designed and fabricated 64×64 supper lattice light emitting diode (SLED) array with peak emission wavelength of 3.8 micron. The light emission is observed from the bottom side of the device through the substrate. The CMOS driver circuit is fabricated in the 130 nm IBM 8HP SiGe process. The unit cells were designed to source up to 100mA to the LED. These unit cells can be individually addressable, and have analog drive and memory that can operate at a 1 kHz array refresh rate. We use supper lattice epitaxial active region LED structures grown on n-type GaSb substrates. After initial mesa etching and contact metal deposition, the LED array is flip chip mounted on the LCC package. The light emission is observed from the LED array by InSb focal plane MWIR camera and the apparent black body temperature is measured.
机译:我们设计并制造了峰值波长为3.8微米的64×64超晶格发光二极管(SLED)阵列。从器件的底侧穿过衬底观察到光发射。 CMOS驱动器电路采用130 nm IBM 8HP SiGe工艺制造。单位电池被设计为向LED提供高达100mA的电流。这些单位单元可以单独寻址,并具有可以以1 kHz阵列刷新率运行的模拟驱动器和存储器。我们使用生长在n型GaSb衬底上的超晶格外延有源区LED结构。在初始台面蚀刻和接触金属沉积之后,将LED阵列倒装芯片安装在LCC封装上。通过InSb焦平面MWIR摄像机从LED阵列观察到发光,并测量了表观黑体温度。

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