【24h】

Large Area Cu(In,Ga)Se_2 Films and Devices on Flexible Substrates Made by Sputtering

机译:溅射制备柔性基板上的大面积Cu(In,Ga)Se_2薄膜和器件

获取原文
获取原文并翻译 | 示例

摘要

A reactive sputtering process was developed for the production of Cu(In,Ga)Se_2 films on a moving stainless steel substrate, in simulation of the operation of a roll coater. Cu, In and Ga fluxes were provided through magnetron sputtering and were reacted in a flux of Se on the heated substrate. CdS films were deposited either by chemical bath deposition (CBD) or by sputtering. Devices of the type steel/Cr/Mo/CIGS/CdS/ZnO/Ag were completed by sputtering ZnO layers and by screen printing grid lines. We made devices with efficiency values above 9%. A uniformity study was performed on a CIGS film and on small area devices made from it. The target length was 12". Targets of this size are expected to produce a uniformly thick deposit over a range of 6-8". The film thickness was 2.54 μm over a range of 6" with a standard deviation σ of 0.04 μm. The film composition was uniform over a range of 16". The values of Cu/III and Ga/III were 0.84 and 0.31, with σ values of 0.02 and 0.01, respectively. The efficiency of all-sputtered devices was uniform over a range of 12", well beyond the 6" wide range of constant CIGS film thickness. Their efficiency was 6.6% on average with σ=0.6%.
机译:通过模拟辊涂机的运行,开发了一种反应溅射工艺,用于在移动的不锈钢基板上生产Cu(In,Ga)Se_2膜。通过磁控溅射提供Cu,In和Ga助熔剂,并在被加热的基板上与Se助熔剂反应。通过化学浴沉积(CBD)或溅射沉积CdS膜。钢/ Cr / Mo / CIGS / CdS / ZnO / Ag类型的设备通过溅射ZnO层并通过丝网印刷网格线完成。我们生产的效率值超过9%的设备。在CIGS薄膜和由其制成的小面积器件上进行了均匀性研究。目标长度为12“。此尺寸的目标可产生6-8”范围内的均匀厚度的沉积物。膜厚度在6”范围内为2.54μm,标准偏差σ为0.04μm。膜组成在16”范围内均匀。 Cu / III和Ga / III的值为0.84和0.31,σ值为0.02和0.01。全溅射器件的效率在12“的范围内是均匀的,远远超出了恒定CIGS膜厚度的6”宽范围。他们的效率平均为6.6%,σ= 0.6%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号