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Epitaxial Growth of Dilute Magnetic Semiconductors: GaMnN and GaMnP

机译:稀磁半导体的外延生长:GaMnN和GaMnP

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摘要

Epitaxial growth of the dilute magnetic semiconductors GaMnP and GaMnN has been investigated by Gas Source Molecular Beam Epitaxy (GSMBE). GaMnP films grown with < 4.5% Mn show the preferential formation of the second phases MnP and Mn_(5.64)P_3, resulting in only a slight deviation from purely diamagnetic behavior. GaMnN films grown on both A1_2O_3 and Metal-Organic Chemical Vapor Deposition (MOCVD) derived GaN surfaces show strong ferromagnetism when grown with either C codoping or at elevated temperatures to raise the concentration of n-type carriers. Comparable GaMnN films grown under conditions which produce highly resistive material show only paramagnetism, indicating the importance of carrier concentration on the resulting magnetic behavior. The formation of second phases was not observed in the GaMnN material for Mn concentrations less than 9%.
机译:稀薄磁性半导体GaMnP和GaMnN的外延生长已通过气源分子束外延(GSMBE)进行了研究。 Mn含量<4.5%的GaMnP薄膜表现出第二相MnP和Mn_(5.64)P_3的优先形成,与纯抗磁性能仅存在微小偏差。在通过C共掺杂或在高温下生长以提高n型载流子浓度时,在Al2_2O_3和金属有机化学气相沉积(MOCVD)衍生的GaN表面上生长的GaMnN膜均显示出强铁磁性。在产生高电阻材料的条件下生长的可比GaMnN膜仅显示顺磁性,表明载流子浓度对所得磁行为的重要性。 Mn浓度小于9%时,在GaMnN材料中未观察到第二相的形成。

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