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Advanced CVD Silicon Carbide Barrier Technology for Protection from Detrimental Gases

机译:先进的CVD碳化硅阻挡层技术可防止有害气体

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Plasma enhanced chemical vapor deposition (PECVD) processes have been developed to produce prototype barrier coatings. The strategy used is based on a combination of molecular precursor design and advanced plasma technology, and represents a route to an effective barrier solution. Room temperature silicon carbide processes have been established on several reactor systems. The impact of process operating factors on the structure and barrier performance has been analyzed and a wide range of tunability has been ascertained. A metrology has been developed to estimate the optical, mechanical, and relevant barrier application properties. In addition, coatings have been analyzed for subnanometer structural defects by Positronium Annihilation Lifetime Spectros-copy (PALS). Based on PALS results, possible structural models of different barrier layers have been elaborated. Significant progress in barrier performance (WVTR in the range of 10~(-4) g/m~2/day) has been demonstrated.
机译:已开发出等离子体增强化学气相沉积(PECVD)工艺来生产原型阻隔涂层。所使用的策略基于分子前体设计和先进的等离子体技术的结合,代表了通往有效屏障解决方案的途径。在几个反应器系统上已经建立了室温碳化硅工艺。分析了工艺操作因素对结构和阻隔性能的影响,并确定了广泛的可调性。已经开发出一种计量学,以估计光学,机械和相关的屏障应用特性。另外,已经通过正电子An灭寿命谱(PALS)分析了涂层的亚纳米结构缺陷。基于PALS结果,已经详细阐述了不同阻挡层的可能结构模型。阻隔性能的显着进步(WVTR在10〜(-4)g / m〜2 /天的范围内)已被证明。

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