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Microstructures and Photoluminescence of electrochemically-deposited ZnO films on porous silicon and Silicon

机译:多孔硅和硅上电化学沉积的ZnO薄膜的微观结构和光致发光

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ZnO films covered with microrods were grown on silicon and porous silicon through electrochemical deposition with silicon or porous silicon as cathode, a platinum wire as anode, and zinc chloride solution of 0.05mol/L as electrolyte. The morphologies by SEM and the crystal structures by XRD were studied. The photoluminescence spectra were also measured. And the mechanisms of the growth and the photoluminescence of the ZnO thin films were analyzed and compared. Studies showed that the luminous intensity of ZnO thin films is different under different conditions, but its peak is located between 370-385nm, luminous intensity of the ZnO film deposited on porous silicon and then annealed is weaker.
机译:以硅或多孔硅为阴极,以铂丝为阳极,以0.05mol / L的氯化锌溶液为电解质,通过电化学沉积法在硅和多孔硅上生长覆盖有微棒的ZnO薄膜。研究了SEM的形貌和XRD的晶体结构。还测量了光致发光光谱。并分析和比较了ZnO薄膜的生长和光致发光机理。研究表明,在不同条件下,ZnO薄膜的发光强度不同,但其峰值在370-385nm之间,沉积在多孔硅上并退火的ZnO薄膜的发光强度较弱。

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