【24h】

Space charge effects in carrier escape from single quantum well structures

机译:载流子从单量子阱结构逸出时的空间电荷效应

获取原文
获取原文并翻译 | 示例

摘要

Steady-state photoluminescence and photocurrent efficiencies have been measured for single quantum well (SQW) p-i-n devices at forward bias over a range of temperature. These efficiencies depend on the competition between carrier escape from the well and both radiative and non-radiative recombination. From the efficiencies, two dimensionless parameters can be obtained; each depends only on the importance of escape relative to one of teh two recombination processes. One of the parameters shows an unexpected thermal activation. An explantation is advanced in terms of band-bending cused by space charge in the well.
机译:已经测量了单量子阱(SQW)p-i-n器件在一定温度范围内的正向偏置下的稳态光致发光和光电流效率。这些效率取决于从井中逸出的载流子与辐射和非辐射复合的竞争。从效率上,可以获得两个无量纲的参数。每个相对于两个重组过程之一仅取决于逃逸的重要性。参数之一显示意外的热激活。根据井中空间电荷引起的带弯曲,外植体是先进的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号