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Contact effects on the threshold voltage extraction in organic thin-film transistors

机译:接触效应对有机薄膜晶体管中阈值电压提取的影响

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In this work, contact effects on the threshold voltage (VT) extraction in top-contact bottom-gate organic thin-film transistors (OTFTs) were investigated. The VT is extracted by the limear extrapolation of the ID0.5-versus-FG function to VGaxis in the saturation regime. As shown in Fig.2 the VT of Au OTFTs is much more dependent on the channel length than that of the Cu TFTs, which is caused by the different contact properties in the devices of the two different metals. The detaied physical mechanisms will be disscussed. And the results indicated that a proper VT extraction method excluding the contact effects is demanded for accurate characterization and modeling of OTFTs.
机译:在这项工作中,研究了顶接触底栅有机薄膜晶体管(OTFT)中阈值电压(VT)提取的接触效应。通过在饱和状态下将ID0.5对FG函数对VGaxis进行线性外推来提取VT。如图2所示,Au OTFT的VT比Cu TFT的沟道长度更多地取决于沟道长度,这是由两种不同金属的器件中不同的接触特性引起的。将讨论详细的物理机制。结果表明,需要正确的VT提取方法,排除接触效应,以对OTFT进行准确的表征和建模。

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