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Threshold Voltage Control Of Bottom-contact N-channel Organic Thin-film Transistors Using Modified Drain/source Electrodes

机译:使用改进的漏极/源极电极的底接触N沟道有机薄膜晶体管的阈值电压控制

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Bottom-contact n-channel C_(60) thin-film transistors (TFTs) with drain/source electrodes modified by benzenethiol derivatives have been fabricated to investigate the influence of the modification on the transistor characteristics. Modification using methylbenzenethiol, aminobenzenethiol, and (dimethylamino)benzenethiol having electron-donating groups causes threshold voltages to shift to low voltages. In addition, the modification provides no significant decrease in saturation mobilities. A C_(60) TFT with (dimethylamino)benzenethiol-modified electrodes has a low threshold voltage of 5.1 V as compared to that of 16.8 V for a TFT with nonmodified electrodes. The threshold-voltage shift is probably because the modification reduces electron-injection barrier height and improves electron injection into organic semiconductors.
机译:为了研究这种改性对晶体管特性的影响,已经制造出了具有由苯硫醇衍生物改性的漏/源电极的底接触n沟道C_(60)薄膜晶体管(TFT)。使用具有给电子基团的甲基苯硫醇,氨基苯硫醇和(二甲基氨基)苯硫醇的改性导致阈值电压转变为低电压。另外,该修饰没有显着降低饱和迁移率。具有(二甲基氨基)苯硫醇修饰的电极的C_(60)TFT具有5.1 V的低阈值电压,而具有未修饰的电极的TFT具有16.8 V的阈值电压。阈值电压偏移可能是因为该修改降低了电子注入势垒高度并改善了向有机半导体中的电子注入。

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