首页> 外文会议>Power Quality and Supply Reliability Conference, 2008 >An Analytical Drain Current Model for AlGaN/GaN Metal Insulator Semiconductor Heterostructure Field Effect Transistor (MISHFET): A Comparative Study with Conventional HFETs for High Power Microwave Applications
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An Analytical Drain Current Model for AlGaN/GaN Metal Insulator Semiconductor Heterostructure Field Effect Transistor (MISHFET): A Comparative Study with Conventional HFETs for High Power Microwave Applications

机译:AlGaN / GaN金属绝缘体半导体异质结构场效应晶体管(MISHFET)的分析漏电流模型:与用于大功率微波应用的常规HFET的比较研究

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摘要

An analytical drain current model of a novel device architecture- AlGaN/GaN Metal Insulator Semiconductor Heterostructure Field Effect Transistor (MISHFET) has been presented to assess the microwave performance of the device for sub micron gate lengths. T
机译:提出了一种新型器件架构的分析漏极电流模型-AlGaN / GaN金属绝缘体半导体异质结构场效应晶体管(MISHFET),以评估亚微米级栅极长度的器件的微波性能。 Ť

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