Fourier transform refractometry

摘要

Abstract: We describe instrumentation that has been constructed at the National Institute of Standards and Technology (NIST) for measurement of the index of refraction of solid materials in the spectral region from 0.5 micrometer to 1000 micrometer using Fourier-transform based spectrophotometers and etalon samples. Preliminary index of refraction measurements have been performed on fused silica and arsenic trisulfide glass samples from 0.5 micrometer to 12 micrometer, and the results are compared to tabulated values on these materials. !10