Self-focusing x-ray spectrometer using mica as the dispersive element

摘要

A new crystal spectrometer has been designed and fabricated for measuring laser-plasma x-ray in the 0.99-1.83-nm region. The cleaved mica crystal with 0.2-mm thickness was curved and glued on an elliptical substrate as the dispersive element. The x-ray source and exit slit are respectively placed at the first and second focal point of the elliptical crystal. The x-ray is diffracted by the mica crystal and focused at the exit slit. An x-ray sensitive charge coupled device or streak camera can be easily amounted in the perpendicular orientation to record the space and time resolved x-ray spectra. The spectrometer was tested at the XG-2 laser facility, and the experimental result shows that the maximum spectral resolution is 999.