Contrast modification for ultra-high resolution low-coherence interference microscopy by Fourier-plane filtering

摘要

We present a novel full-field low-coherence interference (LCI) microscope, which exhibits ultra-high axial resolution due to a broadband super continuum light source and which is at the same time capable to generate different contrast modes by using Fourier-plane filtering with a spatial light modulator. By changing the phase and spatial frequencies of the backreflected wavefront of the specimen in the sample arm of the interferometer, we are able to change the contrast in the depth-resolved LCI images. By displaying different filters on the SLM, as e.g. spiral phase, the resulting images provide particular enhancement of edges and internal structures, and expose details within the specimen that are not visible in normal bright-field mode.