首页> 外国专利> LOW-COHERENCE INTERFEROMETER, LOW-COHERENCE INTERFERENCE APPARATUS, AND LOW-COHERENCE INTERFERENCE MEASURING METHOD

LOW-COHERENCE INTERFEROMETER, LOW-COHERENCE INTERFERENCE APPARATUS, AND LOW-COHERENCE INTERFERENCE MEASURING METHOD

机译:低相干性干涉仪,低相干性干涉仪和低相干性干涉测量方法

摘要

PROBLEM TO BE SOLVED: To provide a low-coherence interferometer which improves measurement efficiency by reducing the width of the scanning range of an optical path length difference.;SOLUTION: The low-coherence interferometer includes light sources (1, 21) which have optical frequency widths for measuring a distance range as an object to be measured by a low-coherence interference method and generate wide-band modulated light which is intensity-modulated over the optical frequency direction, and optical systems (9, 18) which divide the wide-band modulated light generated by the light sources and guides the light to both an object (12) to be measured, and a reference object (15) and generates an interference signal by allowing measuring light from the object to be measured and reference light from the reference object to interfere with each other.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种低相干干涉仪,其通过减小光程长度差的扫描范围的宽度来提高测量效率。;解决方案:低相干干涉仪包括具有光学特性的光源(1、21)用于通过低相干干涉法测量作为被测对象的距离范围的频率宽度,并产生在光频率方向上被强度调制的宽带调制光,以及将宽幅划分的光学系统(9、18)光源产生的宽带调制光将光引导到要测量的物体(12)和参考物体(15)并通过允许测量来自被测物体的光和来自参考物体的参考光产生干涉​​信号相互干扰的参考对象。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010122043A

    专利类型

  • 公开/公告日2010-06-03

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20080295433

  • 发明设计人 NAKAYAMA SHIGERU;TAKIGAWA YUICHI;

    申请日2008-11-19

  • 分类号G01B9/02;G01B11/24;G01B11;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:14

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