首页> 外文会议>Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE >4H-SiC Schottky photodiodes for ultraviolet light detection
【24h】

4H-SiC Schottky photodiodes for ultraviolet light detection

机译:用于紫外线检测的4H-SiC肖特基光电二极管

获取原文

摘要

In recent years Silicon Carbide (SiC) photodiodes have been proposed for ultraviolet (UV) light detection because of their robustness even in harsh environments, high quantum efficiency in all the UV range (200 nm–400 nm), excellent visible blindness, low dark current and high speed. Here, we report on the electro-optical performances and use in application of high signal-to noise ratio low reverse biased 4H-SiC vertical Schottky photodiodes based on the pinch-off surface effect, obtained by means of self-aligned Nickel Silicide (Ni
机译:近年来,由于碳化硅(SiC)光电二极管即使在恶劣的环境中也很坚固,在所有UV范围(200 nm-400 nm)中都具有高量子效率,出色的可见盲性,低暗度,因此被提议用于紫外(UV)光检测。当前和高速。在这里,我们报道了电光性能,并基于夹断表面效应通过自对准硅化镍(Ni)获得了高信噪比低反向偏置4H-SiC垂直肖特基光电二极管。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号