Probability of Integrated Circuits Failures on Influence of Pulsed Radio-Wave Radiation

机译：集成电路故障的可能性对脉冲无线电波辐射的影响

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A theoretical development of the damages accumulation model is presented. The probability and energy of IC damage is determined as a function of number of electromagnetic pulses N. This model qualitative describes the pulse repetition frequency dependence

机译：提出了损害累积模型的理论发展。 IC损坏的可能性和能量取决于电磁脉冲N的数量。此模型定性描述了脉冲重复频率的依赖性

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《Microwave and Telecommunication Technology, 2006 16th International Crimean》|2006年|P.719-720|共2页
会议地点 SevastopolUkraine
作者
A. V. Solodov;
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electromagnetic pulse; integrated circuit reliability; probability; radiowaves; IC damage; electromagnetic pulse; failure energy; integrated circuits failure probability; pulse repetition frequency; pulsed radio-wave radiation; quantitative coincidence;

机译：电磁脉冲集成电路可靠性；可能性;无线电波; IC损坏；电磁脉冲失效能量集成电路故障概率；脉冲重复频率脉冲无线电波辐射；数量巧合;
入库时间 2022-08-26 14:37:40

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1. A Technique for Estimating the Probability of Radiation-Stimulated Failures of Integrated Microcircuits in Low-Intensity Radiation Fields: Application to the Spektr-R Spacecraft [J] . V. D. Popov, N. M. Khamidullina Cosmic research . 2006,第5期

机译：低强度辐射场中集成微电路辐射激发故障的概率估计技术：在Spektr-R航天器中的应用
2. Estimation of the Probability of Radiation Failures and Single Particle Upsets of Integrated Microcircuits onboard the Fobos-Grunt Spacecraft [J] . N. V. Kuznetsov, V. D. Popov, N. M. Khamidullina Cosmic research . 2005,第3期

机译：Fobos-Grunt航天器上集成微电路的辐射失效和单粒子扰动概率的估计
3. Methods of Assessing the Influence of Ultrashort Electromagnetic Pulses and Ultrahigh Frequency Radiation on Integrated Circuits [J] . Anarbayev Alibek Yersainovich, Antontsev Alexandr Vitalievich, Shaikhin Agibai Kaliakovich Biosciences Biotechnology Research Asia . 2015,第1期

机译：评估超短电磁脉冲和超高频辐射对集成电路影响的方法
4. Probability of Integrated Circuits Failures on Influence of Pulsed Radio-Wave Radiation [C] . A. V. Solodov . 2006

机译：集成电路故障的可能性对脉冲无线电波辐射的影响
5. THE SIMULATION OF PULSED-IONIZING - RADIATION-INDUCED ERRORS IN CMOS MEMORY CIRCUITS. [D] . MASSENGILL, LLOYD WILSON. 1987

机译：CMOS存储器电路中脉冲电离辐射引起的误差的仿真。
6. Dielectric Spectroscopic Detection of Early Failures in 3-D Integrated Circuits [O] . Yaw Obeng, C. A. Okoro, Jung-Joon Ahn, -1

机译：介电谱检测3-D集成电路中的早期故障
7. Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection [O] . Jacob Savir 1980

机译：通过最大化故障检测概率测试组合电路中的单个间歇性故障
8. Study of Contact Failures in Integrated Circuits. [R] . schnable,george l. keen,ralph s. 1972

机译：集成电路接触故障的研究。

Probability of Integrated Circuits Failures on Influence of Pulsed Radio-Wave Radiation

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