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Methods of Assessing the Influence of Ultrashort Electromagnetic Pulses and Ultrahigh Frequency Radiation on Integrated Circuits

机译:评估超短电磁脉冲和超高频辐射对集成电路影响的方法

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摘要

This paper describes the direct and indirect methods of assessing the influence of ultra-short electromagnetic pulses on integrated circuits. Stability of electronic equipment and its components under ultra-short electromagnetic pulses and ultrahigh frequency radiation has been experimentally assessed. Various dependencies of the indicator of some integrated circuits malfunction within the duration of ultra-short electromagnetic pulses and ultrahigh frequency energy have been assessed.
机译:本文介绍了评估超短电磁脉冲对集成电路影响的直接和间接方法。已经通过实验评估了电子设备及其组件在超短电磁脉冲和超高频辐射下的稳定性。已经评估了在超短电磁脉冲和超高频能量持续时间内某些集成电路故障指示器的各种依赖性。

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