Grain Size Determination and Grain Boundary Characterization of Nanocrystalline Thin Films From Conical Dark Field Imaging

著录项

• 来源
  《Microscopy and microanalysis.;Microscopy and microanalysis.》|2010年|p.1276-1277|共2页
• 会议地点 Portland OR(US)
• 作者

  A. Darbal; K. Barmak; T. Nuhfer; T. Sun; K. R. Coffey;

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• 作者单位

  Materials Research Science and Engineering Center and the Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213;

  Materials Research Science and Engineering Center and the Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213;

  Materials Research Science and Engineering Center and the Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213;

  Advanced Materials Processing and Analysis Center, University of Central Florida, 4000 Central Florida Boulevard, Orlando, FL 32816;

  Advanced Materials Processing and Analysis Center, University of Central Florida, 4000 Central Florida Boulevard, Orlando, FL 32816;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 显微镜;
• 关键词

• 入库时间 2022-08-26 14:10:07