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Modeling of Electrical Properties of Power/Ground Planes in Electronics Packaging

机译:电子封装中电源/接地平面的电气特性建模

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摘要

In electronics packaging, surge currents caused by simultaneously switched drivers will result in voltage fluctuations on power/ground conducting planes. With increasing number of I/Os and speed of switching, the simultaneous switching noise (SSN) can lead to system malfunction. Accurate modeling and efficient simulation of the power/ground plane structures are crucial to predict and reduce the SSN. This paper presents the derivation of analytical models of electrical properties of power/ground planes in electronics packaging, as well as numerical techniques for transient waveform simulation. Analytical models of power/ground planes are based on the radial transmission line theory. SPICE-type equivalent circuits are extracted from analytical models, and transient waveforms can then be simulated by SPICE. An alternative approach, which uses electromagnetic field solvers to directly simulate transient responses of power/ground plane structures, is also presented. Several representative examples, including single and multi-layer packaging structures, are given as illustration.
机译:在电子产品包装中,由同时切换的驱动器引起的浪涌电流将导致电源/接地导体板上的电压波动。随着I / O数量的增加和切换速度的提高,同时切换噪声(SSN)会导致系统故障。电源/地平面结构的准确建模和有效仿真对于预测和降低SSN至关重要。本文介绍了电子封装中电源/接地层电特性分析模型的推导,以及用于瞬态波形仿真的数值技术。电源/接地层的分析模型基于径向传输线理论。从分析模型中提取SPICE型等效电路,然后可以通过SPICE模拟瞬态波形。还提出了一种替代方法,该方法使用电磁场求解器直接模拟电源/地平面结构的瞬态响应。给出几个代表性的例子,包括单层和多层包装结构,作为说明。

著录项

  • 来源
  • 会议地点 Beijing(CN)
  • 作者单位

    Department of Electrical Engineering State University of New York at Binghamton, Binghamton, NY 13902, USA;

    Department of Electrical Engineering State University of New York at Binghamton, Binghamton, NY 13902, USA;

    Department of Electrical Engineering State University of New York at Binghamton, Binghamton, NY 13902, USA;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 微电子学、集成电路(IC);
  • 关键词

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