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Circuit Modeling of Shielded Differential Carbon Nanotube Bundle Filled Through-Silicon Vias

机译:屏蔽差分碳纳米管束填充硅通孔的电路建模

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In this paper, a modified shielded differential through-silicon vias (SD-TSVs) with the concept of multi-bit TSV is presented. The TSV is filled with vertically aligned carbon nanotube (VACNT) array, and two metal pads are deposited on the sides of the surface of that TSV to form differential signal transmission paths. The equivalent circuit model is established, meanwhile, the partial-element equivalent-circuit (PEEC) method is utilized to extract the frequency-dependent impedance of that SD-TSVs. By virtue of the equivalent circuit model, the electrical performance of the proposed SD-TSVs is investigated.
机译:在本文中,提出了具有多比特TSV概念的改进的屏蔽差分通过硅通孔(SD-TSV)。 TSV填充有垂直对准的碳纳米管(VACNT)阵列,并且在该TSV的表面的侧面上沉积两个金属焊盘以形成差分信号传输路径。同时建立等效电路模型,同时利用部分元素等效电路(PEEC)方法来提取该SD-TSV的频率依赖性阻抗。借助于等效电路模型,研究了所提出的SD-TSV的电性能。

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