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50nm - gate all around (GAA) - silicon on nothing (SON) - devices: a simple way to co-integration of GAA transistors within bulk MOSFET process

机译:50nm - 门口全部(Gaa) - 无所过(儿子) - 器件 - 设备:一种简单的方法,可以在散装MOSFET过程中共同集成GaA晶体管

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摘要

Far the first time, bath GAA and bulk devices were shown operational an the same chip. Nat all issues have been salved yet (gate materials, access resistance) but already the first-try results are very encouraging: lon= 170μA/μm @ 1.2V and gate oxide of 20A. Thanks to the GM intrinsic immunity to SCE, its DIBL was as small as 10mV compared with 6OOmV on bulk control devices. Calibrating 2D simulator an this electrical data, the performance of GAA was estimated to at least 1500μA/μm @ 1V with comfortable gate oxide of 20A, once having corrected far the large R{sub}(access) (~3OOOΩ), that was simply due to non-optimal mask layout we used in this first device realization.
机译:首次,浴Gaa和散装设备首次出现了同一芯片。 NAT所有问题都已售罄(栅极材料,访问阻力)但已经是第一个尝试结果非常令人鼓舞:LON =170μA/μm@ 1.2V和20A的栅极氧化物。由于散装控制装置上的60MV相比,由于转基因的基因内在免疫力,其DIBL等于10mV。校准2D模拟器该电气数据,Gaa的性能估计为至少1500μA/μm@ 1V,允许舒适的栅极氧化物为20a,一旦校正了大的R {sub}(访问)(〜3OOOΩ),即简单由于我们在第一个设备中使用的非最佳掩模布局。

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