首页> 外文会议>International Electronics Manufacturing Technology Conference;IEMT 2012;IEEE/CPMT International Electronics Manufacturing Technology Symposium >Effect of Ni, Ge and P Addition in Sn-Ag-Cu Lead-free Solder on Solder Joint Properties with Electroless Ni/Au Electrodes
【24h】

Effect of Ni, Ge and P Addition in Sn-Ag-Cu Lead-free Solder on Solder Joint Properties with Electroless Ni/Au Electrodes

机译:Ni,Ge和P加入Sn-Ag-Cu无铅焊料在焊接接头性能与无电镀Ni / Au电极的影响

获取原文

摘要

The effect of addition of small-amount of Ni, Ge and P into Sn-3Ag-0.5Cu lead-free solder was investigated on microstructures and ball shear force of solder ball joints with electroless Ni/Au electrodes. At low shear speed, fracture mainly occurred in solder and ball shear force increased with increasing shear speed regardless of the solder type. At high shear speed, the fracture mode changed from solder fracture to IMC fracture and thus ball shear force decreased. The effect of single Ge addition was negligible on microstructures and ball shear force of the solder ball joints. On the contrary, the single P addition degraded ball shear force. The complex addition of Ni and P was effective to inhibit the degradation of ball shear force by the single P addition.
机译:在具有化学镀Ni / Au电极的焊球接头的微结构和球剪切中,研究了添加量小Ni,Ge Ge和p进入Sn-3Ag-0.5Cu无铅焊料的效果。 在低剪切速度下,由于焊料型,焊料和球剪切力的裂缝主要发生在焊料和球剪切力中增加。 在高剪切速度下,断裂模式从焊料骨折变为IMC骨折,因此球剪切力降低。 在焊球接头的微观结构和球剪切力上可以忽略不计。 相反,单个P加法降低球剪力。 通过单个P添加抑制球形剪切力的较大,添加Ni和P的复杂添加是有效的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号