In this paper a new approach that targets the reduction of both the test-data volume and the scan-power dissipation during testing of a digital system??s cores is proposed. For achieving the two aforementioned goals, a novel algorithm that inserts some inverters in the scan chain(s) of the core under test (CUT) is presented. However, no performance or area penalty is imposed on the CUT since, instead of additional inverters, the negated outputs of the scan flip-flops can be utilized. The proposed algorithm targets the maximization of run-lengths of zeros (or ones) in the test set accompanying the CUT. This algorithm combined with the Minimum Transition Count mapping of don??t cares in a test set as well as with the alternating run-length code that have been recently proposed, achieves better test-data compression and reduced scan-power results than the relative works in the literature.
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