Low Power Scan-Based Testing

摘要

In a low power scan-based testing process, the loading of a test pattern may involve only a portion of the scan chains and the capturing of test response data for the test pattern may involve another portion of the scan chains. The two portions of the scan chains may be determined based on test patterns applied before and after the current test pattern. Clock gating circuitry may be used to select the two portions of the scan chains.