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A Transient Noise Analysis of Secured Dual-Rail Based Logic Style

机译:安全双轨逻辑风格的瞬态噪声分析

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Dual-rail logic circuits have been used as an effective countermeasure towards a more secure circuit design. However, with technology scaling and lowering of VDD, they lose interest as the signal reduction is less significant compared to CMOS. In this work, we revisit dual-rail logic designs (more specifically DDSLL) while focusing on intrinsic physical device noise using a transient noise analysis methodology and show that there exists a potential for such circuits to reduce the signal and concretely increase the noise. Our analysis, which extends to meaningful cryptographic figures-of-merit (FoMs) such as the SNR (Signal-to-Noise ratio) and Mutual-Information (MI), better clarifies the potential of DDSLL circuits to leverage the noise.
机译:双轨逻辑电路已被用作更安全的电路设计的有效对策。但是,具有技术缩放和降低的v dd ,与CMOS相比,由于信号减少不显着,它们会失去兴趣。在这项工作中,我们重新审视双铁路逻辑设计(更具体地说,DDSLL),同时使用瞬态噪声分析方法专注于内在物理设备噪声,并表明这种电路有可能降低信号并具体增加噪声。我们的分析,它延伸到有意义的加密图 - 优选(FOM),例如SNR(信噪比比)和互信息(MI),更好地阐明了DDSLL电路的电位,以利用噪声。

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