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XPS Study of Plasma Modified PVDF-TrFE Films Surface

机译:XPS改性PVDF-TRFE薄膜表面研究

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The impact of surface plasma modification on PVDF-TrFE film with different exposure time was investigated using X-ray photoelectron spectroscopy (XPS). The main emphasis of this study was to optimize the exposure time of argon plasma on the surface of PVDF-TrFE films The surface of spin coated PVDF-TrFE film was modified with argon plasma at exposure time of 1, 3, 5, 7 and 9 min/s. Prior to modification, only small amount of atomic percent (1.92 %) of O1s peak was observed at 540.8 eV, but upon modification, the atomic percent for O1s peak was found to increase to 8.8%. Meanwhile, the atomic percent for F1s peak observed at 695.3 eV was found to decrease from 70.6% to 61.2%. This phenomenon is an indication that plasma modified PVDF-TrFE films were readily oxidized. Importantly, most of the fluorine elements were removed from the modified PVDF-TrFE film surface, which rendered the film favourable for adhesion with other material for coating aplications.
机译:使用X射线光电子谱(XPS)研究了表面等离子体改性对具有不同暴露时间的PVDF-TRFE膜的影响。本研究的主要重点是优化PVDF-TRFE膜表面上的氩等离子体的曝光时间,在1,3,5,7和9的暴露时间下用氩等离子体改性旋涂的PVDF-TRFE膜的表面。分钟。在修饰之前,仅在540.8eV中观察到O1S峰的少量原子百分比(1.92%),但在改性后,发现O1S峰的原子百分比增加到8.8%。同时,发现在695.3eV中观察到的F1S峰的原子百分比从70.6%降至61.2%。这种现象表明血浆改性PVDF-TRFE膜容易氧化。重要的是,大部分氟元素从改性的PVDF-TRFE膜表面中除去,这使得使薄膜有利于与其他材料粘合的涂层涂料。

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