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The Influence of Gas Pressure on the H Line Shape in the Gap of Dielectric Barrier Discharge Generated in Helium—Hydrogen Gas Mixtures

机译:气体压力对氦 - 氢气混合物中产生的介电阻挡放电间隙H线形状的影响

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In a gas mixture consisting of 99.5% of helium and 0.5% of molecular hydrogen, dielectric barrier discharges are generated by applying AC voltage to two electrodes, deposited on the outward surfaces of the ceramic plates. The two ceramic plates made of BaTiO3 form a slit-like discharge gap of 0.5 mm (distance between the inward ceramic surfaces). The radiation of the hydrogen H spectral line emitted from this gas gap is studied, applying gas pressures from 4 kPa to 60 kPa. The H line shapes emitted from this gap are measured with spectral and spatial resolution (in the direction perpendicular to the ceramic surface). The light detection system, equipped with a chopper (synchronized with the feeding voltage) allows light polarization sensitive measurements to be performed. The observed large broadening of the H profile is attributed mainly to the linear Stark effect. On the basis of analyzed H line shapes the electric field strengths in the gas gap at different pressures are determined.
机译:在由99.5%的氦和0.5%的分子氢组成的气体混合物中,通过向两个电极施加沉积在陶瓷板的向外表面上而产生介电阻挡放电。由BATIO3制成的两个陶瓷板形成0.5mm(内侧陶瓷表面之间的距离)的狭缝状放电间隙。研究了从该气隙发出的氢气H光谱线的辐射,将气体压力从4kPa施加到60kPa。从该间隙发出的H线形以光谱和空间分辨率(沿垂直于陶瓷表面的方向)测量。配备斩波器(与馈电电压同步)配备的光检测系统允许进行光偏振敏感测量。观察到的H个谱的大扩大主要归因于线性滞留效应。在分析的H线形的基础上,确定了在不同压力下的气体间隙中的电场强度。

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