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Excellent Photoelectrical Properties of ZnO Thin Film based on ZnO /epoxy-resin Ink for UV-Light Detectors

机译:基于ZnO /环氧树脂油墨的ZnO薄膜的优异光电性能,用于UV光探测器

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This paper presents the photoconductive properties of ZnO thin film prepared by simple drop-cast technique using an ink of ZnO/epoxy-resin on glass substrate. The prepared film is investigated for structural analysis under X-ray diffraction technique which confirms the nanocrystalline nature of the prepared thin film, whereas, the UV-photodetection ability of the prepared film has been investigated under UV light of wavelength ~ 365nm light in ambient environment at room temperature in parallel electrode geometry (silver/ZnO/silver). The prepared thin film showed excellent UV photodetection ability with a change in current greater than two orders (>10~2) and a photoresponse better than 5x10~4 (%). Thus, the present technique pave the way to use a cost effective approach to develop excellent UV photodetectors contrary the existing complex and expensive sensor technology.
机译:本文介绍了在玻璃基板上使用ZnO /环氧树脂的油墨制备的ZnO薄膜的光电导性能。研究了制备的薄膜在X射线衍射技术下进行结构分析,其证实制备薄膜的纳米晶体性质,而制备的薄膜的UV光电检测能力在环境环境中的波长〜365nm光的紫外线下进行了研究在平行电极几何(银/ ZnO /银)的室温下。制备的薄膜显示出优异的UV光电检测能力,随着电流的变化大于两个订单(> 10〜2),光源优于5×10〜4(%)。因此,本技术铺平了使用成本有效的方法来开发出优异的紫外光电探测器的方法,这与现有的复杂和昂贵的传感器技术相反。

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