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Microscopic and Macroscopic Bipolar Injection and Carrier Recombination in Single-layer Si Nanocrystals

机译:单层Si纳米晶体中的显微镜和宏观双极注射和载体重组

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Si nanocrystals(NCs)based optoelectronic devices have attracted more and more attentions due to the quasi-direct energy band structure and the adjustable band gap of Si NCs.In these optoelectronic devices,the carrier injection and recombination process is a crucial issue and needs to be deeply understood.Here,bipolar carrier injection and recombination process in a single layer of Si NCs was observed at the microscopic and macroscopic scales,by electrostatic force microscopy(EFM)and alternating-current electroluminescence(ac EL)measurement,respectively.EFM result showed that opposite charges could be injected into the single-layer Si NCs and they would laterally recombine with each other.On the other hand,the single-layer Si NCs also showed a frequency dependent EL intensity,which was attributed to the time limitation of carrier injection and radiative recombination process.
机译:基于Si NanoCrystals(NCS)的光电器件由于准直接能带结构和Si NCS的可调节带隙而引起了越来越多的关注。在这些光电器件,载体注射和重组过程中是一种至关重要的问题,需要被深入理解。通过静电力显微镜(EFM)和交流电致发光(AC EL)测量,在微观和宏观尺度观察到单层Si NCS中的双极载体注射和复合过程。表明,可以将相反的电荷注入单层Si NC,并且它们将彼此横向重新组合。另一方面,单层Si NC也显示出频率相关的EL强度,其归因于时间限制载体注射和辐射重组过程。

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