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Technology Computer Aided Design of a Novel Fully Gate Covered Channel Junctionless SOI FinFET for high performance analog application

机译:技术计算机辅助设计新型全门覆盖频道连接不可能SOI FinFET用于高性能模拟应用

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This work presents the analysis of various analog performance parameters of a fully gate-covered channel junctionless (JL) SOI FinFET with a high-k dielectric gate oxide, which is compared to the conventional junctionless SOI. The device exhibits an increase in the performance characteristics with respect to the conventional device, in terms of the switching ratio (about 100 times), transconductance (by about 10 times) and parameters like early voltage and intrinsic gain also improved. The devices also show a great reduction of DIBL, by about 60 mV/V and better SCE characteristics. These performance enhancements make the device suitable for certain applications involving high switching speeds and make them a good option for high-performance analog applications.
机译:该工作介绍了具有高k介质栅极氧化物的完全栅极覆盖的通道连接(JL)SOI FinFET的各种模拟性能参数的分析,其与传统的连接SOI相比。 就切换比(约100次),跨导(约10次)和早期电压和内在增益等参数也提高了该装置的性能特性增加了相对于传统装置的性能特征的增加。 该器件还显示DIBL的大约40mB / V和更好的SCE特性。 这些性能增强功能使设备适用于某些涉及高开关速度的应用,并使它们成为高性能模拟应用的良好选择。

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